CHY-BT3.0 Transistor Tracer 4-inch HD SPI Color Screen Transistor Characteristic Curve Tester with Transistor Testing Socket

CHY-BT3.0 Transistor Tracer 4-inch HD SPI Color Screen Transistor Characteristic Curve Tester with Transistor Testing Socket

Features:
- Non polarity conversion switch, select polarity N or P through the menu, scan and test all four quadrants at once when measuring the thyristor, and display the positive and negative polarity of the diode characteristic curve at once. The high-voltage withstand voltage test linearly increases from 0V to 2000V. If the current exceeds the set value during testing, it indicates breakdown and the scanning voltage becomes 0. All test curves are displayed with corresponding voltage and current values, and relevant parameters are automatically calculated and displayed on the screen without the need for grid counting.

Specifications:
- The working power supply is 220V input, and the internal working voltage of the machine is supplied by dual 24V 20A positive and negative power supplies.
- Product size: 240 x 120 x 210mm; display screen: 480x320 resolution, 4-inch high-definition SPI color screen.
- The maximum voltage withstand test is 2000V, with three current levels: 0.5mA, 1mA, and 2mA.
- Maximum base current of 1000mA and minimum current of 30UA.
- Collector/drain current maximum value 20A, minimum value of 12MA.
- Testing of triodes output characteristics with a scanning period of approximately 114ms for a single cluster and 1140ms for a full scan.
- MOS tube enhanced output characteristic test scan cycle: single cluster about 38.5ms, full scan 934ms.
- The depletion type output characteristic curve of JFET tube has a scanning period of about 36ms for a single cluster and 500ms for a full scan.
- The maximum scanning time for voltage withstand test is less than 650ms.
- Unidirectional thyristor scanning time of 500ms, bidirectional four quadrant scanning time of 220ms.

Package Included:
- 1 x Tester
- 1 x Testing Socket